A)The Band OFFSET in SiGe is used to increase mobility.
1)for p - MOS most holes in the channel are confined to SiGe
2)for n-MOSFET a fraction of channel electrons move in SiGe
Band offset and strain properties improve performance
introducing Ge in Si-mos improves performance
an additional increase in mobility is induced by strain
B) NMOS strain was introduced by adding a high-stress layer that wrapped around the transistor (a process sometimes named CESL, or contact etch-stop layer after the most common layer used for the stressor). PMOS strain was introduced by replacing the conventional source/drain region with strained SiGe (a process often called embedded-SiGe or e-SiGe). The addition of strain in both NMOS and PMOS enhanced the channel mobility, resulting in improved drive current (and improved performance) for both NMOS and PMOS.
Strained-Si (10%) nd nMOS made on Hitachi's SiGe Virtual Substrate, published at IED 2001, demonstrated excellent...