Question

Explain which place between flat and vertical surfaces is brighter in SEM image and how diffraction is characterized with SEM 10. What can you say about the crystal structures from the following TEM selected area diffraction patterns? 9. (200 toi 211

Answer 1

As Student didn't asked for both to solve so I am providing answer of 9 only.

Scanning electron microscope (SEM) is basically a special kind of electron microscope that is used to produce images of a pattern via scanning the surface with a focused beam of electrons. The electrons engage with atoms in the sample, generating various signals that incorporate statistics about the surface topography and composition of the sample.The electron beam is scanned in a raster experiment pattern, and the position of the beam is combined with the intensity of the detected sign to produce an photo. In the most not unusual SEM mode, secondary electrons emitted via atoms excited through the electron beam are detected the use of an Everhart-Thornley detector. The quantity of secondary electrons that may be detected, and accordingly the sign depth, relies upon, among other matters, on specimen topography. SEM can acquire decision better than 1 nanometer. Steep surfaces and edges tend to be brighter than flat surfaces, which results in images with a well-defined, three-dimensional appearance.

Accelerated electrons inside the number one beam of a scanning electron microscope (SEM) can be diffracted by means of atomic layers in crystalline substances.These patterns are effectively projections of the geometry of the lattice planes inside the crystal, and they give direct data about the crystalline shape and crystallographic orientation of the grain from which they are originate