Consider a silicon crystal doped with 10^16 cm-3 Boron. Due to contamination, this crystal also contains...
Consider a silicon crystal doped with 10^16 cm-3 Boron. Due to contamination, this crystal also contains deep level traps with an energy level in the middle of the Si bandgap (In other words, Etrap=Ei) and concentration 10^15 cm-3 . These traps can either act like donors or acceptors. At T=300K, determine if the traps are acting as donors or acceptors. Also determine the position of the Fermi level (EF).
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Consider a silicon crystal doped with 10^16 cm-3 Boron. Due to
contamination, this crystal also contains...
Consider an abrupt p-n junction consisted of a p-side silicon doped with 1.0E+15 cm-3 acceptors and...
Consider an abrupt p-n junction consisted of a p-side silicon doped with 1.0E+15 cm-3 acceptors and an n- side silicon doped with 1.0E+15 cm-3 donors at room temperature (no donors in p-side and no acceptors in n-side). a. Calculate the Fermi levels on each side of the junction with respect to Ei. Use the Special Conditions to find the concentrations. b. Calculate the contact potential. c .Calculate the ratio, Xpo/Xno
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF...
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF-Ev), (Ep-E) at 300 K. Assume all the donor atoms are ionized. (b) Plot the position of Fermi level (EF) in the bandgap as a function of temperature for 300 Ts700 K. In this temperature range, it can be assumed that all the donor atoms are ionized. (c) Plot the position of Fermi level (Er) in the bandgap as acceptor atoms are added (N.- 104,...
If a silicon diffusion is doped with boron at a concentration of 5.0 x 10^17/cm^3, what...
If a silicon diffusion is doped with boron at a concentration of 5.0 x 10^17/cm^3, what is the concentration of electrons in this piece of silicon per cm^3? Assume ni = 1.5 x 10^10/cm^3 at 300°K Answer:
2. (a) A piece of silicon is doped with 5x107/cm boron atoms. Find the hole and...
2. (a) A piece of silicon is doped with 5x107/cm boron atoms. Find the hole and electron concentrations at room temperature (20°C) and at 150°C. (b) Calculate the resistance of the silicon piece in part (a), if it has length of 10 um and cross-section of 10 um'. Use mobility values from the mobility vs carrier concentration plot from lecture slides. (c) Repeat steps (a) and (b) for the Si doped with 104 cm boron atoms. What you mention for...
3. A MOSFET is made on silicon substrate doped with boron with a concentration of 1018 cm. Width and length of channel are 100 and 0.1 micron respectively. Thickness of the oxide insulator under the...
3. A MOSFET is made on silicon substrate doped with boron with a concentration of 1018 cm. Width and length of channel are 100 and 0.1 micron respectively. Thickness of the oxide insulator under the gate is 10 nm. Find transconductance of this transistor and saturation current at gate voltage 6 V. kT (Nc Si eNa2egp Cox
3. A MOSFET is made on silicon substrate doped with boron with a concentration of 1018 cm. Width and length of channel are...
Problem 7 A germanium sample is doped with donors at a level 2 times 10^14/cm^3 and...
Problem 7
A germanium sample is doped with donors at a level 2 times 10^14/cm^3 and no acceptors. Given that n_i = 2.4 times 10^13/cm^3 at 300K: Find the thermal equilibrium electron and hole concentrations at 250K. Repeat part a) for 350K. Speculate on what happens to very low doped materials as temperature increases.
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels...
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed below. Case 1: Case 2: Case 3: Case 4: Ex-Ey = 0.15 eV Ef-Ey=0.88 eV EF-Ey = 0.55 eV Ex-Ey = 1.09 eV The four cases above show the position of the Fermi Level Er relative to the valence band edge Ev.at dilterent doping levels. a) identify each sample as degenerate and nondegenerate. b) which nondegenerate case shows heavy...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described as follows. Na atoms sit at the corners and faces of a cube, and Cl atoms sit in between two Na atoms. This means that a Clatom is found half-way along each of the cube edges, and there is a Cl in the center of the cube. (We could also have described the lattice by interchanging Na and Cl in the description above.) Another...
P4. Find the resistivity at T 300 K for a silicon sample doped with 1 x 10cm of phosphorus (P) atoms, 8.5 x 10 cm o...
P4. Find the resistivity at T 300 K for a silicon sample doped with 1 x 10cm of phosphorus (P) atoms, 8.5 x 10 cm of arsenic (As) atoms, and 1.2 x 103 cm3 of boron (B) atoms. Assume that the impurities are completely ionized and the mobilities are μ,-1500 cm2/V-s, μ,-500 cm2/V-s, independent of impurity concentrations. Also assume intrinsic carrier concentration of Si n 1.5 x 10 cm). Hint!!; we can usually use the rule for compensated semiconductors as...
If 2.5 times 10^14 boron atoms per cm^3 are added to silicon as a substitutional impurity,...
If 2.5 times 10^14 boron atoms per cm^3 are added to silicon as a substitutional impurity, determine what fraction of the silicon atoms are displaced in the lattice. The lattice constant of Si is 5.43 A. In the previous problem, estimate the average distance between the nearest impurity atoms. (Assume the boron atoms form a simple cubic lattice.)
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF-Ev), (Ep-E) at 300 K. Assume all the donor atoms are ionized. (b) Plot the position of Fermi level (EF) in the bandgap as a function of temperature for 300 Ts700 K. In this temperature range, it can be assumed that all the donor atoms are ionized. (c) Plot the position of Fermi level (Er) in the bandgap as acceptor atoms are added (N.- 104,...
If a silicon diffusion is doped with boron at a concentration of 5.0 x 10^17/cm^3, what is the concentration of electrons in this piece of silicon per cm^3? Assume ni = 1.5 x 10^10/cm^3 at 300°K Answer:
2. (a) A piece of silicon is doped with 5x107/cm boron atoms. Find the hole and electron concentrations at room temperature (20°C) and at 150°C. (b) Calculate the resistance of the silicon piece in part (a), if it has length of 10 um and cross-section of 10 um'. Use mobility values from the mobility vs carrier concentration plot from lecture slides. (c) Repeat steps (a) and (b) for the Si doped with 104 cm boron atoms. What you mention for...
3. A MOSFET is made on silicon substrate doped with boron with a concentration of 1018 cm. Width and length of channel are 100 and 0.1 micron respectively. Thickness of the oxide insulator under the gate is 10 nm. Find transconductance of this transistor and saturation current at gate voltage 6 V. kT (Nc Si eNa2egp Cox
3. A MOSFET is made on silicon substrate doped with boron with a concentration of 1018 cm. Width and length of channel are...
Problem 7
A germanium sample is doped with donors at a level 2 times 10^14/cm^3 and no acceptors. Given that n_i = 2.4 times 10^13/cm^3 at 300K: Find the thermal equilibrium electron and hole concentrations at 250K. Repeat part a) for 350K. Speculate on what happens to very low doped materials as temperature increases.
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed below. Case 1: Case 2: Case 3: Case 4: Ex-Ey = 0.15 eV Ef-Ey=0.88 eV EF-Ey = 0.55 eV Ex-Ey = 1.09 eV The four cases above show the position of the Fermi Level Er relative to the valence band edge Ev.at dilterent doping levels. a) identify each sample as degenerate and nondegenerate. b) which nondegenerate case shows heavy...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described as follows. Na atoms sit at the corners and faces of a cube, and Cl atoms sit in between two Na atoms. This means that a Clatom is found half-way along each of the cube edges, and there is a Cl in the center of the cube. (We could also have described the lattice by interchanging Na and Cl in the description above.) Another...
P4. Find the resistivity at T 300 K for a silicon sample doped with 1 x 10cm of phosphorus (P) atoms, 8.5 x 10 cm of arsenic (As) atoms, and 1.2 x 103 cm3 of boron (B) atoms. Assume that the impurities are completely ionized and the mobilities are μ,-1500 cm2/V-s, μ,-500 cm2/V-s, independent of impurity concentrations. Also assume intrinsic carrier concentration of Si n 1.5 x 10 cm). Hint!!; we can usually use the rule for compensated semiconductors as...
If 2.5 times 10^14 boron atoms per cm^3 are added to silicon as a substitutional impurity, determine what fraction of the silicon atoms are displaced in the lattice. The lattice constant of Si is 5.43 A. In the previous problem, estimate the average distance between the nearest impurity atoms. (Assume the boron atoms form a simple cubic lattice.)
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