A1: Transmission electron microscopy(TEM) bright field image. In this image mass-thickness contrast is clearly seen.
A2: Transmission electron microscopy dark field image.In this image diffraction contrast is observed. It is kind of complementray image to A1. The things that appeared dark in bright filed image are bright in dark field image and vice versa.
B: Scanning electron microscopy(SEM) image. SEM images appear more bright and smooth. The image is due to backscattered and secondary electrons. Ans majorly gives surface information of the sample.
C: Scanning electron microscopy image.
D: Energy dispersive spectroscopy image: In this, the sample is mapped for various elements and respective X-rays are analyzed.
QUESTION 2 - Electron Microscopy (12 pts) Below and on the following pages is a series of images and other results fro...
1. Fill out the following table by indicating which general technique (light microscopy (LM) or electron microscopy (EM]) could be used to observe each structure or phenomenon. Put "no" in the box if the technique could not be used. If light microscopy can be used, name one technique (bright-field, phase-contrast, fluorescence, etc.) that you think would be effective. You will find some useful information in Appendix 1 of this manual and Chapter 18 of your textbook. Structure or phenomenon Could...