1.6 The testing of VLSI chips at speed has become increasingly more difficult due to undesirable parasitic effects in resting environment. Also the cost of high-speed testing machines has become very high and hence in reality it has become difficult for smaller manufacturers to procure such equipment. Discuss what problem would the chip testing only at lower speed cause for systems houses which take such chips to develop systems at speed What alternative ways can be used to ease the problem in the absence of at-speed testers?
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