An atomic force microscope (AFM) is a state-of-the-art device used to study the me­chanica...

An atomic force microscope (AFM) is a state-of-the-art device used to study the me­chanical and topological properties of surfaces on length scales as small as the size of individual atoms. The device uses a flexible cantilever beam AB with a very sharp, stiff tip BC that is brought into contact with the surface to be studied. Due to contact forces at C, the cantilever beam deflects. If the tip of the AFM is subjected to the forces shown, determine the resultant moment of both forces about point A. Use both scalar and vector approaches.

Figure P4.5