1. Draw the schematics of forward-biased and negative-biased
diodes. Show the polarity of voltage
source (positive and negative terminal of the source), the position
of Fermi levels and the current
direction. Explain why there is a small current flow when a p-n
junction is under reverse bias.
2. A p-n junction can be made by diffusing acceptor atoms into
an n-type semiconductor. Suppose
that boron is diffused into a silicon wafer doped with arsenic at
1015 cm-3 such that the boron
concentration in the p region is 6 x 1015 cm-3. What are the hole
and electron concentration in the p
region? What is the hole concentration in the n region, that is,
the undoped region beneath the
diffused region? The intrinsic carrier density, ni, is equal to
1.45 x 1010 cm-3 and assume that the
diffused dopant profile resembles a “box” shape.
3. Electronic grade silicon (EGS) is the starting point for the
Czochralski crystal growth process.
Briefly describe the three important steps in the process of
extracting and purifying silicon starting
from raw SiO2 (sand) and ending with single crystal Si..
4. In optical lithography, a smaller wavelength results in better resolution. However, in an x-ray lithography experiment, it is observed that when the wavelength of the x-ray is too small, the resolution is actually worse. Explain this phenomenon.
1. Draw the schematics of forward-biased and negative-biased diodes. Show the polarity of voltage source (positive...
3. A silicon npn bipolar transistor is uniformly doped and biased in the forward active region with the base-collector junction reverse biased by 2.5 V. The metallurgical base width is 1.5 μm. The emitter, base collector doping concentrations are 5 × 1017, 1016, 2 × 1015 cm-3 respectively. a. At T-300 K, calculate the base-emitter voltage at which the minority carrier electron concentration at x-0 is 20% of the majority carrier hole concentration. At this voltage calculate the minority carrier...
Problem 3 (25 points) Consider a silicon pn junction at T - 300 K, NA- 1016 cm3, ND-5x1016 cm-3. The minority carrier lifetimes are τα , τ,-1 us. The junction is forward biased with Va-0.5V The minority carrier diffusion coefficients are D 25 cm/s, Da- 10 cm2/s n,1.5x1010 cm3 kT 0.0267 Depletion region p-type n-type a) (5 points) Calculate the excess electron concentration as a function of x in the p-side (see the figure above) b) (10 points) Calculate the...