The relative conductivity of a semiconductor device is determined by the amount of impur...

The relative conductivity of a semiconductor device is determined by the amount of impurity “doped” into the device during its manufacture. A silicon diode to be used for a specific purpose requires an average cut-on voltage of .60 V, and if this is not achieved, the amount of impurity must be adjusted. A sample of diodes was selected and the cut-on voltage was determined. The accompanying SAS output resulted from a request to test the appropriate hypotheses.

[Note: SAS explicitly tests H₀ : μ = 0, so to test H₀ : μ = .60, the null value .60 must be subtracted from each xi; the reported mean is then the average of the (x_i – .60)values. Also, SAS’s P-value is always for a two-tailed test.] What would be concluded for a significance level of .01? .05? .10?