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1. a. Find the main error in each of the band diagrams shown below. For all...
1. a. Find the main error in each of the band diagrams shown below. For all of the band diagrams Ny 1019/cm3, Ne- 1019/cm3, ni = 3 x 108/cm". E,-1.25 eV, T = 300 K. Ef Ef EFi Main error: Main error: Main error: Main error: Consider a semiconductor sample with the following characteristics: EG 1.25 eV, T 300 K, Nd 5 x 101*/cm3, Na 1014/cm3, N.-1019/cm3, N.-1019/cm3, ni-3 × 108/cm3. Assume complete ionization b. Find the equilibrium electron and...
1252 407 3. At 300 K the electron mobility in n-type silicon in cm?N.s can be...
1252 407 3. At 300 K the electron mobility in n-type silicon in cm?N.s can be approximated as un = 88+ - 0.88*n where N is 1+1.26 X 1017 the total ionized impurity concentration /cm? At 300 K the hole mobility in p-type silicon in cm N.s can be approximated as Hp = 54 + 5.88xN where N is the total ionized impurity concentration /cm3. Use these equations to generate plots of electron and hole mobility in silicon as a...
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF...
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF-Ev), (Ep-E) at 300 K. Assume all the donor atoms are ionized. (b) Plot the position of Fermi level (EF) in the bandgap as a function of temperature for 300 Ts700 K. In this temperature range, it can be assumed that all the donor atoms are ionized. (c) Plot the position of Fermi level (Er) in the bandgap as acceptor atoms are added (N.- 104,...
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels...
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed below. Case 1: Case 2: Case 3: Case 4: Ex-Ey = 0.15 eV Ef-Ey=0.88 eV EF-Ey = 0.55 eV Ex-Ey = 1.09 eV The four cases above show the position of the Fermi Level Er relative to the valence band edge Ev.at dilterent doping levels. a) identify each sample as degenerate and nondegenerate. b) which nondegenerate case shows heavy...
Find barrier height, built-in voltage, maximum E- field, and the depletion layer width at equilibrium for...
Find barrier height, built-in voltage, maximum E- field, and the depletion layer width at equilibrium for W-Si (n-type) contact (tungsten silicide) Given: Φ,-4.55eV for WX(Si)-4.01 eV: Si doping - 1016 cm-3 Draw the band diagram at equilibrium. Required Constants: for silicon at T-300°K, ni-1010/cm3. The Boltzmann constant kg-k-8.61x10-eV/K. Silicon bandgap energy Ev-1.12 eV
Hi everyone, I have a problem about semiconductor. Please help me with it,thanks a lot. Background:...
Hi everyone, I have a problem about semiconductor.
Please help me with it,thanks a lot.
Background:
Question:
Physical Constants: Vacuum permittivity: £o = 8.85 x 10-14 F/cm Planck's constant: h=6.63 x 10-34 J-s Speed of light: c= 3.0 x 100 cm/s Electronic charge: q=1.60 x 10-19 C Electron rest mass: m. = 9.11 x 10-31 kg Boltzmann constant: kb = 1.38 x 10-23 J/K Thermal energy at 300 K: kBT = 0.0259 eV Energy unit conversion: 1eV = 1.60 x...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described as follows. Na atoms sit at the corners and faces of a cube, and Cl atoms sit in between two Na atoms. This means that a Clatom is found half-way along each of the cube edges, and there is a Cl in the center of the cube. (We could also have described the lattice by interchanging Na and Cl in the description above.) Another...
Please help me out.. Need to pass this course as a removal for my other course.....
Please help me out.. Need to pass this course as a removal for
my other course..
Si material parameters: Band gap energy at 300 K: Eg = 1.124 eV Relative permittivity: x = 11.7 Effective mass of electron: m =1.08m for density of states, Effective mass of hole: m = 0.81m for density of states, m = 0.26m for conductivity m =0.39m for conductivity Up = 470 cm/V.s Mobility: Un = 1400 cm /V-s, Diffusion coefficient: Do = 36 cm²/s,...
please answer 7.17, i put 7.10 for reference. Consider a uniformly doped silicon pn junction with...
please answer 7.17, i put 7.10 for reference.
Consider a uniformly doped silicon pn junction with doping concentrations N 2 x 7.10 = 1017 cm3and N = 4 X 1016 cm3. (a) Determine Vhi at T = 300 K. (b) Determine the temperature at which Vhi increases by 2 percent. (Trial and error may have to be used.) 7.17 Consider the pn junction described in Problem 7.10 for T = 300 K. The cross- sectional area of the junction is...
An IC circuit requires that we design a 50 n-type resistor in a p- type Si wafer. the acceptir do...
an IC circuit requires that we design a 50 n-type
resistor in a p- type Si wafer. the acceptir doping is 1014/cm3,
the donor implant depth is 5 micro met, the lenght of the registor
is 20 micromet, and the maximum width allowed is 15 micromet.
caculate the required donor density. assume that 1000cm2/Vs
300cm2/Vs
Note c 3x10m/s, h-6.63x10 J-s, mo-9.11x10 kg, q-1.6x 10-19 C, nis-1.5x10/cm3. Eo-8.85x10-12 F/m, Erst 11.8, k-1.38x1023 J/K, Ers1o2-3.9, T-300K, 1 eV-1.6x10-19 J I. An IC...
1. a. Find the main error in each of the band diagrams shown below. For all of the band diagrams Ny 1019/cm3, Ne- 1019/cm3, ni = 3 x 108/cm". E,-1.25 eV, T = 300 K. Ef Ef EFi Main error: Main error: Main error: Main error: Consider a semiconductor sample with the following characteristics: EG 1.25 eV, T 300 K, Nd 5 x 101*/cm3, Na 1014/cm3, N.-1019/cm3, N.-1019/cm3, ni-3 × 108/cm3. Assume complete ionization b. Find the equilibrium electron and...
1252 407 3. At 300 K the electron mobility in n-type silicon in cm?N.s can be approximated as un = 88+ - 0.88*n where N is 1+1.26 X 1017 the total ionized impurity concentration /cm? At 300 K the hole mobility in p-type silicon in cm N.s can be approximated as Hp = 54 + 5.88xN where N is the total ionized impurity concentration /cm3. Use these equations to generate plots of electron and hole mobility in silicon as a...
6. A silicon wafer is doped with donor atoms, N-5x0 cm(bonus question) (a) Determine (Ec-EF), (EF-Ev), (Ep-E) at 300 K. Assume all the donor atoms are ionized. (b) Plot the position of Fermi level (EF) in the bandgap as a function of temperature for 300 Ts700 K. In this temperature range, it can be assumed that all the donor atoms are ionized. (c) Plot the position of Fermi level (Er) in the bandgap as acceptor atoms are added (N.- 104,...
3. Silicon samples with band-gas 1.1 eV at 300 Kelvin, are doped at four different levels and have the properties listed below. Case 1: Case 2: Case 3: Case 4: Ex-Ey = 0.15 eV Ef-Ey=0.88 eV EF-Ey = 0.55 eV Ex-Ey = 1.09 eV The four cases above show the position of the Fermi Level Er relative to the valence band edge Ev.at dilterent doping levels. a) identify each sample as degenerate and nondegenerate. b) which nondegenerate case shows heavy...
Find barrier height, built-in voltage, maximum E- field, and the depletion layer width at equilibrium for W-Si (n-type) contact (tungsten silicide) Given: Φ,-4.55eV for WX(Si)-4.01 eV: Si doping - 1016 cm-3 Draw the band diagram at equilibrium. Required Constants: for silicon at T-300°K, ni-1010/cm3. The Boltzmann constant kg-k-8.61x10-eV/K. Silicon bandgap energy Ev-1.12 eV
Hi everyone, I have a problem about semiconductor.
Please help me with it,thanks a lot.
Background:
Question:
Physical Constants: Vacuum permittivity: £o = 8.85 x 10-14 F/cm Planck's constant: h=6.63 x 10-34 J-s Speed of light: c= 3.0 x 100 cm/s Electronic charge: q=1.60 x 10-19 C Electron rest mass: m. = 9.11 x 10-31 kg Boltzmann constant: kb = 1.38 x 10-23 J/K Thermal energy at 300 K: kBT = 0.0259 eV Energy unit conversion: 1eV = 1.60 x...
EENG 245 Physical electronics HW 1 1) The NaCl crystal is cubic, and can be described as follows. Na atoms sit at the corners and faces of a cube, and Cl atoms sit in between two Na atoms. This means that a Clatom is found half-way along each of the cube edges, and there is a Cl in the center of the cube. (We could also have described the lattice by interchanging Na and Cl in the description above.) Another...
Please help me out.. Need to pass this course as a removal for
my other course..
Si material parameters: Band gap energy at 300 K: Eg = 1.124 eV Relative permittivity: x = 11.7 Effective mass of electron: m =1.08m for density of states, Effective mass of hole: m = 0.81m for density of states, m = 0.26m for conductivity m =0.39m for conductivity Up = 470 cm/V.s Mobility: Un = 1400 cm /V-s, Diffusion coefficient: Do = 36 cm²/s,...
please answer 7.17, i put 7.10 for reference.
Consider a uniformly doped silicon pn junction with doping concentrations N 2 x 7.10 = 1017 cm3and N = 4 X 1016 cm3. (a) Determine Vhi at T = 300 K. (b) Determine the temperature at which Vhi increases by 2 percent. (Trial and error may have to be used.) 7.17 Consider the pn junction described in Problem 7.10 for T = 300 K. The cross- sectional area of the junction is...
an IC circuit requires that we design a 50 n-type
resistor in a p- type Si wafer. the acceptir doping is 1014/cm3,
the donor implant depth is 5 micro met, the lenght of the registor
is 20 micromet, and the maximum width allowed is 15 micromet.
caculate the required donor density. assume that 1000cm2/Vs
300cm2/Vs
Note c 3x10m/s, h-6.63x10 J-s, mo-9.11x10 kg, q-1.6x 10-19 C, nis-1.5x10/cm3. Eo-8.85x10-12 F/m, Erst 11.8, k-1.38x1023 J/K, Ers1o2-3.9, T-300K, 1 eV-1.6x10-19 J I. An IC...
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