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Problem 8.1 Helium ion microscopy is a type of scanned-beam microscopy where patches of a sample ...

Problem 8.1

Helium ion microscopy is a type of scanned-beam microscopy where patches of a sample are imaged one at a time. In other words, the pixels of the micrograph are acquired one at a time, either by moving the beam or by moving the sample. At patch (i, j), a number of helium ions with the Poisson(λ) distribution strikes the sample. For each helium ion that strikes the sample, a number of secondary electrons with the Poisson(ηi,j ) distribution is detected. The process is repeated for each (i, j) ∈ {1, 2, ..., n}2 to form an n×n micrograph. All the Poisson random variables described above are mutually independent.

(a) For the moment assume the ηi,j values are known constants. What are the mean and variance of the number of detected secondary electrons at a single pixel (i, j)?

(b) Now assume that each ηi,j is independent with the uniform(1,5) distribution. What are the mean and variance of the number of detected secondary electrons at a single pixel (i, j)?

(c) Using the model from part (b), what are the mean and variance of the total number of detected secondary electrons over an entire n × n pixel data collection?

(d) For this type of microscopy, a good measure of signal-to-noise ratio is the mean number of detections divided by the standard deviation of the number of detections. What is this SNR? How does it vary with λ and n?

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