Question

1.Write about the five factors that influence the diffraction intensity and write what kind of information the factors give to the unknown psalm structure

2. write powder, bulk, thin film diffraction experimence feature

Answer 1

DATE Ant The factoxs that influence the_diffnaction Electron an An elect non will Oscillate in phose lth an to the follaingcquation- 1Co2) bea accag 2 Io I = intensity of I ia the the incidert beam. Hene Thind teim inaling the Cosine function is called Palaizationactobecause it indicotes incoming non-polaeized ztoy Scattexed intensiy islatized irectional Vasiation in the that the in a eultive esentialy scatexng f th. the an Atom Tis Sum af theL lectr on loidd" a1ound the nucleus- called the atomic Scatitm The Phenomenan is octor BecaLge of the distance hetween e within the adm and the fact that ig of the Some 09deg the atomic dimensiong thetie_will be path dfexencesbehveen the Scateyed waves itecfexence il. 02 the Hence the auays be Patzöally devsuctive

DATE Anmalaus Scattexing > TE OCCU8_lwhen the incident1-91ay Cause photoeleic. Ctom. This Sufficient to faget phenamenan is 9103pansiblefos "absoxption edge phenomenon in which_a charactenistic paaduced Poradces Coheent lightly out of phase with Photon is Subseguent iateiaction -X-21Q^A Which n9e. othegr Cokerently scattexd а 9educton esltig S47 scattexef itengityfom of the elenment d Thermal motion The thesmas Vihsatiol atom will amplitude of the have an ry scatesng descibed hy the follauing relationshipi TŁ IS Debye-ialle temPesiahue factor ard defined a: B = & nu 03 Tinc Bease B wil inckease Bis the Фhen B O the. follaa the seatiesing Thempson eauation will

The Stuctre facto St9uch The of the atomg_in the UnUt Cell in the differactio of those elements and the 91esettg_into the total diffactian in the Stuctue iS o means. grouping plana elcents, developing intensities frem Cach iagseating intensityomeach due plane Ans XRD is a methad to Knm the yStaline Sthucture. The materiak which_be used ia Substate deposition it isimpoxtont to Knaa Some Ponameters about motexials uch as latice Canstant, dislocation deraity Sain. ond Buk Sciontifc Pouden diffiaction chniguc aing X-1ayneutom on omicotallině samples fax Stáuchural Choractexizotion of maksias The instument uged fs this is caled a poudeg diffactometer. mostly uged tn_chasacterize_and tentfy phases and to refinc details of an known_Stauctune, xathex_thon pouden LIt is Tt alko obtaing adiffiacio Un knn Shuctures o pstaline Patten for the bulk matexial f Solid

b Thin-El it reguies high nesalution XRD_ Theseane useful technigue in stguctuxog charaderizotion of thun films deteiming Lotice mismath between flmthe thickýress, xoughness density of the flon using glancig nefleitivity incidence meaiuxemgnt