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Problem3: Consider a MOS capacitor maintained at T 300K with the following characteristics: Assume Esi 1.9,x 3.9,8.85 x 10-14 F/cm, and n 1.5 x 1010cm3 . Gate material is n+ poly-silicon . Total n...
Problem 3: Consider a MOS capacitor maintained at T= 300K with the following characteristics: Assume s 11.9, ox 3.9, 8.85x 10-1 F/cm, and n 1.5 x 1010cm3 Gate material is n poly-silicon Total...
Problem 3: Consider a MOS capacitor maintained at T= 300K with the following characteristics: Assume s 11.9, ox 3.9, 8.85x 10-1 F/cm, and n 1.5 x 1010cm3 Gate material is n poly-silicon Total negative oxide charge of 5x 1011q C/cm . Substrate is n-type Si, with doping concentration 1 x1016 cm-3 Oxide thickness 5 nmm The electron affinity for Si is 4.03eV? e) What is the flat capacitance? f) What is the depletion region width? g) What is the potential...
Problem 5: The gate capacitance vs. gate voltage characteristic of a p+ poly-Si gated MOS capacitor of area 1x10"cm', is as shown: Assume Esi = 11.9, Eox-39,E,-8.85 × 10-14 F/on, and nl =...
Problem 5: The gate capacitance vs. gate voltage characteristic of a p+ poly-Si gated MOS capacitor of area 1x10"cm', is as shown: Assume Esi = 11.9, Eox-39,E,-8.85 × 10-14 F/on, and nl = 1.5 x 1010 cm3 Co [Farads] 3.45x1011 >Va [Volts] 1.0 0.3 (a) Is the semiconductor (silicon) substrate doped n-type or p-type? Explain briefly. (b) Is the measurement frequency low or high? Explain briefly. (c) What is the thickness of the gate oxide (SiO2), xo? (d) Estimate the...
Problem l: The capacitance vs. gate voltage characteristic of a simple MOS capacitor of area 100 μιηχ 1 00pm is as shown: Assume Esi-1 1.9, Eox-3.9, Eo-8.85 >< 10-14 F/cm, and ni-1.5x 1010cm...
Problem l: The capacitance vs. gate voltage characteristic of a simple MOS capacitor of area 100 μιηχ 1 00pm is as shown: Assume Esi-1 1.9, Eox-3.9, Eo-8.85 >< 10-14 F/cm, and ni-1.5x 1010cm3 C (pF) 70 ECV) 0.25 a) What is the thickness of the gate oxide (Sio2)? b) Does the capacitor have a metal gate or poly-Si gate? Why? c) Is the substrate n-type or p-type? How do you know? d) Estimate the values of VFB and VrH. e)...
A MOS capacitor is made on n-type silicon with oxide thickness of 50 A, a positive interface charge of 5 x 1010 cm2 and...
A MOS capacitor is made on n-type silicon with oxide thickness of 50 A, a positive interface charge of 5 x 1010 cm2 and a uniform positive oxide charge of density p- 2 x 106 cm3 throughout the oxide. The substrate is doped with Na-101" cm3 and the gate is polysilicon doped with boron just to the edge of degeneracy (p+ poly, Ef -Ev). a. Calculate the flat band voltage VB and the threshold voltage Vr b. Sketch the charge...
Consider an n-channel Silicon MOS system with a substrate resistivity of 10 0-cm and with a...
Consider an n-channel Silicon MOS system with a substrate resistivity of 10 0-cm and with a polycrystalline gate. Assume that the polysilicon gate is doped with boron atoms to a density of 1x1019 cm and that the silicon dioxide is 50 nm-thick. The channel is not biased except from the gate (Vc= VB = 0). (i) Accurately sketch the band diagram identifying flatband voltage, surface potential at inversion, depletion width at inversion, and charges at inversion. Tabulate these parameters. (ii)...
Problem 3 (25 points) Consider a MOS capacitor with p polysilicon gate and p-type silicon substrate with NA 1016 cm3. Ef- Ev in the polysilicon gate. Assume the following parameters: I200A, , 1.5x10°...
Problem 3 (25 points) Consider a MOS capacitor with p polysilicon gate and p-type silicon substrate with NA 1016 cm3. Ef- Ev in the polysilicon gate. Assume the following parameters: I200A, , 1.5x10° cm*,E, -3.9x8.854x104FIcm ox a) (5 points) Calculate the metal-semiconductor work function difference. b) (5 points) Calculate the surface potential at the threshold inversion. c) (5 points) Calculate the depletion width (in μm) at the threshold inversion. d) (5 points) Calculate the flat band voltage. e) (5 points)...
Problem 6: The energy band diagram for an ideal MOS-capacitor is shown below. tx 0.2 μm and Ep = E, at the Si-SiO2 interface. Assume no oxide charge and φ'm5-0. Answer the following. EpM Eps T...
Problem 6: The energy band diagram for an ideal MOS-capacitor is shown below. tx 0.2 μm and Ep = E, at the Si-SiO2 interface. Assume no oxide charge and φ'm5-0. Answer the following. EpM Eps Toz9ev 055ev a) What is the numerical value of the electron concentration at the Si-SiO2 interface? b) What is the substrate doping type and concentration? c) What is the electrostatic potential at the Si-SiO2 interface? d) What would be the depletion depth (width)? e) What...
Consider a P-body MOS capacitor with following parameters: doping in the body region Na1015 cm-3, thickness...
Consider a P-body MOS capacitor with following parameters: doping in the body region Na1015 cm-3, thickness of the oxide layer tax-0.05 μm, and N+ poly-Si gate. We would like to make a MOSFET from this capacitor device, but first we must calculate the critical voltage points for the capacitor itself. Electron Affinity (energy difference between the conduction band level and vacuum level) of Si is 4.05 eV. Calculate (a) yb (hint: find the ψg and ψ's for the capacitor, for...
Q1 Which of the following is true for a MOS capacitor with a P-type body? Select...
Q1 Which of the following is true for a MOS capacitor with a P-type body? Select one: a. The charge in the inversion layer stays approximately constant as the gate voltage is increased above the threshold voltage b. The charge in the depletion region is proportional to the square root of the depletion region width, assuming that the body is uniformly doped c. In inversion, the total charge is equal to the sum of the charge in the depletion region...
Problem 3: Consider a MOS capacitor maintained at T= 300K with the following characteristics: Assume s 11.9, ox 3.9, 8.85x 10-1 F/cm, and n 1.5 x 1010cm3 Gate material is n poly-silicon Total negative oxide charge of 5x 1011q C/cm . Substrate is n-type Si, with doping concentration 1 x1016 cm-3 Oxide thickness 5 nmm The electron affinity for Si is 4.03eV? e) What is the flat capacitance? f) What is the depletion region width? g) What is the potential...
Problem 5: The gate capacitance vs. gate voltage characteristic of a p+ poly-Si gated MOS capacitor of area 1x10"cm', is as shown: Assume Esi = 11.9, Eox-39,E,-8.85 × 10-14 F/on, and nl = 1.5 x 1010 cm3 Co [Farads] 3.45x1011 >Va [Volts] 1.0 0.3 (a) Is the semiconductor (silicon) substrate doped n-type or p-type? Explain briefly. (b) Is the measurement frequency low or high? Explain briefly. (c) What is the thickness of the gate oxide (SiO2), xo? (d) Estimate the...
Problem l: The capacitance vs. gate voltage characteristic of a simple MOS capacitor of area 100 μιηχ 1 00pm is as shown: Assume Esi-1 1.9, Eox-3.9, Eo-8.85 >< 10-14 F/cm, and ni-1.5x 1010cm3 C (pF) 70 ECV) 0.25 a) What is the thickness of the gate oxide (Sio2)? b) Does the capacitor have a metal gate or poly-Si gate? Why? c) Is the substrate n-type or p-type? How do you know? d) Estimate the values of VFB and VrH. e)...
A MOS capacitor is made on n-type silicon with oxide thickness of 50 A, a positive interface charge of 5 x 1010 cm2 and a uniform positive oxide charge of density p- 2 x 106 cm3 throughout the oxide. The substrate is doped with Na-101" cm3 and the gate is polysilicon doped with boron just to the edge of degeneracy (p+ poly, Ef -Ev). a. Calculate the flat band voltage VB and the threshold voltage Vr b. Sketch the charge...
Consider an n-channel Silicon MOS system with a substrate resistivity of 10 0-cm and with a polycrystalline gate. Assume that the polysilicon gate is doped with boron atoms to a density of 1x1019 cm and that the silicon dioxide is 50 nm-thick. The channel is not biased except from the gate (Vc= VB = 0). (i) Accurately sketch the band diagram identifying flatband voltage, surface potential at inversion, depletion width at inversion, and charges at inversion. Tabulate these parameters. (ii)...
Problem 3 (25 points) Consider a MOS capacitor with p polysilicon gate and p-type silicon substrate with NA 1016 cm3. Ef- Ev in the polysilicon gate. Assume the following parameters: I200A, , 1.5x10° cm*,E, -3.9x8.854x104FIcm ox a) (5 points) Calculate the metal-semiconductor work function difference. b) (5 points) Calculate the surface potential at the threshold inversion. c) (5 points) Calculate the depletion width (in μm) at the threshold inversion. d) (5 points) Calculate the flat band voltage. e) (5 points)...
Problem 6: The energy band diagram for an ideal MOS-capacitor is shown below. tx 0.2 μm and Ep = E, at the Si-SiO2 interface. Assume no oxide charge and φ'm5-0. Answer the following. EpM Eps Toz9ev 055ev a) What is the numerical value of the electron concentration at the Si-SiO2 interface? b) What is the substrate doping type and concentration? c) What is the electrostatic potential at the Si-SiO2 interface? d) What would be the depletion depth (width)? e) What...
Consider a P-body MOS capacitor with following parameters: doping in the body region Na1015 cm-3, thickness of the oxide layer tax-0.05 μm, and N+ poly-Si gate. We would like to make a MOSFET from this capacitor device, but first we must calculate the critical voltage points for the capacitor itself. Electron Affinity (energy difference between the conduction band level and vacuum level) of Si is 4.05 eV. Calculate (a) yb (hint: find the ψg and ψ's for the capacitor, for...
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